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The Suppression Mechanism of Parasitic Capacitance for Comb Capacitor Fabricated with Silicon-On-Insulation

  • Xi'an Jiaotong University
  • China Xi'an Satellite Control Center
  • Xi'an Aerospace Propulsion Institute

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper establishes theoretical circuit and electrostatic current multi-physical field simulation models for a typical comb capacitor fabricated with silicon-on-insulation. The influence of related electrical parameters and conditions on equivalent capacitance is revealed by analytical solution and simulation, and several methods are proposed to suppress the interference of parasitic capacitance on ideal capacitance, such as high-resistivity substrate Si, relatively high-frequency excitation, and grounded substrate Si. The models and methods proposed in this paper can provide theoretical guidance for the design and suppression of parasitic capacitance of MEMS (Micro-Electro-Mechanical System) capacitive sensors.

Original languageEnglish
Title of host publication2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350359831
DOIs
StatePublished - 2024
Event19th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024 - Kyoto, Japan
Duration: 2 May 20245 May 2024

Publication series

Name2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024

Conference

Conference19th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024
Country/TerritoryJapan
CityKyoto
Period2/05/245/05/24

Keywords

  • FEM
  • SOI
  • comb
  • parasitic capacitance

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