TY - GEN
T1 - The influence of the cathode radius on the microgap breakdown in air based on PIC/MCC simulation
AU - Meng, Guodong
AU - Ying, Qi
AU - Wang, Kejing
AU - Gao, Xinyu
AU - Cheng, Yonghong
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - Traditionally, Paschen's Law is used to describe and predict the gas breakdown. However, more and more experiments have shown that the Paschen's Law fails when the gap dimensions fall below 10μm, and this new curve was known as the modified Paschen's curve. In this work, we proposed a simulation model based on the particle-in-cell/Monte Carlo (PIC/MCC) collisions method and calculated the breakdown thresholds with different cathode radii and gap distances in microgaps. Results show that the critical gap distances for the transition process and the plateau region varied with the cathode radius, and the relationship between the discharge process and the cathode radius, which demonstrates a good consistence with the experimental breakdown thresholds, and the series of simulation results has guiding significance for further research on the microscale dielectric breakdown theory.
AB - Traditionally, Paschen's Law is used to describe and predict the gas breakdown. However, more and more experiments have shown that the Paschen's Law fails when the gap dimensions fall below 10μm, and this new curve was known as the modified Paschen's curve. In this work, we proposed a simulation model based on the particle-in-cell/Monte Carlo (PIC/MCC) collisions method and calculated the breakdown thresholds with different cathode radii and gap distances in microgaps. Results show that the critical gap distances for the transition process and the plateau region varied with the cathode radius, and the relationship between the discharge process and the cathode radius, which demonstrates a good consistence with the experimental breakdown thresholds, and the series of simulation results has guiding significance for further research on the microscale dielectric breakdown theory.
UR - https://www.scopus.com/pages/publications/85081649769
U2 - 10.1109/CEIDP47102.2019.9009716
DO - 10.1109/CEIDP47102.2019.9009716
M3 - 会议稿件
AN - SCOPUS:85081649769
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 769
EP - 772
BT - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019
Y2 - 20 October 2019 through 23 October 2019
ER -