Abstract
Preliminary experimental results have shown that an unexpected large needle-like phase Ag3Sn grows from the solder/substrate interface and large polygon-like Sn-Cu intermetallic compounds are present in the region, which is close to the interface when using lead-free binary Sn3.5Ag solder alloy. This paper summarises the efforts made to prevent the formation of these deleterious phases. An addition of 0.25 wt% of either copper nano-particles or nickel nano-particles was found to effectively avoid the formation of large Ag3Sn phase and to modify the solder matrix through a random dispersion of the in-situ intermetallic compounds Cu6Sn5 or Sn4Ni3. The mechanism involved in influencing the interfacial structure is quite different for copper and nickel nano-particles. The addition of copper nano-particles stimulates the formation of the Sn-Cu compound Cu6Sn5 at the solder/substrate interface, while the nickel nano-particles promotes the formation of Sn-Cu-Ni-Ag compound to replace the regular scallop-like Cu6Sn5 having a round morphology.
| Original language | English |
|---|---|
| Pages (from-to) | 357-369 |
| Number of pages | 13 |
| Journal | International Journal of Nanomanufacturing |
| Volume | 1 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2007 |
Keywords
- copper
- interfacial structure
- lead free solders
- microstructure
- nano-particles
- nickel
- reinforcement
- Sn3.5Ag solder
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