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The influence of nano-particles on microstructural development at the interface of Sn3.5Ag-solder and Cu-substrate

  • D. C. Lin
  • , T. S. Srivatsan
  • , G. X. Wang
  • , R. Kovacevic
  • Southern Methodist University
  • University of Akron

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Preliminary experimental results have shown that an unexpected large needle-like phase Ag3Sn grows from the solder/substrate interface and large polygon-like Sn-Cu intermetallic compounds are present in the region, which is close to the interface when using lead-free binary Sn3.5Ag solder alloy. This paper summarises the efforts made to prevent the formation of these deleterious phases. An addition of 0.25 wt% of either copper nano-particles or nickel nano-particles was found to effectively avoid the formation of large Ag3Sn phase and to modify the solder matrix through a random dispersion of the in-situ intermetallic compounds Cu6Sn5 or Sn4Ni3. The mechanism involved in influencing the interfacial structure is quite different for copper and nickel nano-particles. The addition of copper nano-particles stimulates the formation of the Sn-Cu compound Cu6Sn5 at the solder/substrate interface, while the nickel nano-particles promotes the formation of Sn-Cu-Ni-Ag compound to replace the regular scallop-like Cu6Sn5 having a round morphology.

Original languageEnglish
Pages (from-to)357-369
Number of pages13
JournalInternational Journal of Nanomanufacturing
Volume1
Issue number3
DOIs
StatePublished - 2007

Keywords

  • copper
  • interfacial structure
  • lead free solders
  • microstructure
  • nano-particles
  • nickel
  • reinforcement
  • Sn3.5Ag solder

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