Abstract
In this paper, the influence of contact materials on late discharges in vacuum switching devices was investigated. Experimental results show that the HV withstand capability of contact materials has a strong influence on the frequency of late discharges in vacuum switching devices. The addition of a small amount of W and Co into the CuCr alloy increases the voltage withstand significantly, resulting in a reduction of the frequency of late discharges by as much as 50%. Therefore, an efficient approach to decrease the frequency of late discharges is to increase trie HV withstand of the contact materials.
| Original language | English |
|---|---|
| Pages (from-to) | 913-915 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Dielectrics and Electrical Insulation |
| Volume | 6 |
| Issue number | 6 |
| DOIs | |
| State | Published - Dec 1999 |