Abstract
We have investigated the fluorescence decay time of ZnO:Ga scintillator under the excitation of different type charged particles, namely β (0–1.173 MeV), α (5.48 MeV), H+ (15 MeV), Li+ (42 MeV) and O8+ (100 MeV) ions. A strong dependence of decay time on the rate of energy loss dE/dx can be observed. Simulation result shows that the instantaneous non-equilibrium carriers induced by charged particles significantly decrease the local refractive index of semiconductor, which consequently gives rise to a slower decay time for a larger value of dE/dx. The present result has an entire different physical mechanism from the traditional organic and inorganic scintillators such as CsI:Na. This finding could be applied in pulse shape discrimination measurement in a mixed transient radiation field.
| Original language | English |
|---|---|
| Article number | 116520 |
| Journal | Journal of Luminescence |
| Volume | 214 |
| DOIs | |
| State | Published - Oct 2019 |
| Externally published | Yes |
Keywords
- Decay time
- Scintillator
- ZnO
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