TY - GEN
T1 - The charge carrier trap energy levels of two different polyimide films characterized by three methods
AU - Zhang, Peihong
AU - Wang, Xuan
AU - Yang, Chun
AU - Lei, Qingquan
PY - 2009
Y1 - 2009
N2 - The charge carrier trap energy level is an important parameter that will affect the electrical and optical properties of insulating and semiconducting materials. Depending on the characterizing methods, it has a remarkable difference. The trap energy levels of two kinds of polyimide films, original (100HN) and corona-resistant (100CR) ones produced by Dupont, are estimated by depolarization current, space charge limited current and thermally stimulated current method. The corresponding values are 1.185eV-1.200eV and 1.168eV-1.220eV, 0.93eV and 0.76eV, 0.65-0.91eV and 0.60-0.90eV, respectively. These results show that the trap energy level of polymers comes significantly under the influence of heating procedures, and the shallower traps are constructed in corona-resistant polyimide film.
AB - The charge carrier trap energy level is an important parameter that will affect the electrical and optical properties of insulating and semiconducting materials. Depending on the characterizing methods, it has a remarkable difference. The trap energy levels of two kinds of polyimide films, original (100HN) and corona-resistant (100CR) ones produced by Dupont, are estimated by depolarization current, space charge limited current and thermally stimulated current method. The corresponding values are 1.185eV-1.200eV and 1.168eV-1.220eV, 0.93eV and 0.76eV, 0.65-0.91eV and 0.60-0.90eV, respectively. These results show that the trap energy level of polymers comes significantly under the influence of heating procedures, and the shallower traps are constructed in corona-resistant polyimide film.
UR - https://www.scopus.com/pages/publications/71049166012
U2 - 10.1109/ICPADM.2009.5252239
DO - 10.1109/ICPADM.2009.5252239
M3 - 会议稿件
AN - SCOPUS:71049166012
SN - 9781424443680
T3 - Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
SP - 891
EP - 894
BT - 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009
T2 - 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009
Y2 - 19 July 2009 through 23 July 2009
ER -