TY - GEN
T1 - The analysis and structural design of micro SOl pressure sensors
AU - Tian, Bian
AU - Zhao, Yulong
AU - Jiang, Zhuangde
AU - Zhang, Ling
AU - Liao, Nansheng
AU - Liu, Yuanhao
AU - Meng, Chao
PY - 2009
Y1 - 2009
N2 - A kind of micro piezoresistive pressure sensor with stable performances under high temperature is designed based on the silicon on insulator (SOl). Through analyzing the stress distribution of diaphragm by finite element method (FEM), the model of structure was established. The fabrication operated on SOl wafer, which can be used in extreme high temperature environments, and applied the technology of anisotropy chemical etching. Performances of this kind of SOl piezoresistive sensor, including size, sensitivity, and temperature were investigated. The result shows that the precision is O.57% FS. Therefore, this kind of design not only has smaller size, simplicity preparation but also has high sensitivity, temperature coefficient and accuracy.
AB - A kind of micro piezoresistive pressure sensor with stable performances under high temperature is designed based on the silicon on insulator (SOl). Through analyzing the stress distribution of diaphragm by finite element method (FEM), the model of structure was established. The fabrication operated on SOl wafer, which can be used in extreme high temperature environments, and applied the technology of anisotropy chemical etching. Performances of this kind of SOl piezoresistive sensor, including size, sensitivity, and temperature were investigated. The result shows that the precision is O.57% FS. Therefore, this kind of design not only has smaller size, simplicity preparation but also has high sensitivity, temperature coefficient and accuracy.
KW - FEM
KW - High temperature
KW - Pressure
KW - SOI
UR - https://www.scopus.com/pages/publications/70349656112
U2 - 10.1109/NEMS.2009.5068526
DO - 10.1109/NEMS.2009.5068526
M3 - 会议稿件
AN - SCOPUS:70349656112
SN - 9781424446308
T3 - 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2009
SP - 55
EP - 58
BT - 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2009
T2 - 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2009
Y2 - 5 January 2009 through 8 January 2009
ER -