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Texture Complexity Based Redundant Regions Ranking for Object Proposal

  • Wei Ke
  • , Tianliang Zhang
  • , Jie Chen
  • , Fang Wan
  • , Qixiang Ye
  • , Zhenjun Han
  • University of Chinese Academy of Sciences
  • University of Oulu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Object proposal has been successfully applied in recent visual object detection approaches and shown improved computational efficiency. The purpose of object proposal is to use as few as regions to cover as many as objects. In this paper, we propose a strategy named Texture Complexity based Redundant Regions Ranking (TCR) for object proposal. Our approach first produces rich but redundant regions using a color segmentation approach, i.e. Selective Search. It then uses Texture Complexity (TC) based on complete contour number and Local Binary Pattern (LBP) entropy to measure the objectness score of each region. By ranking based on the TC, it is expected that as many as true object regions are preserved, while the number of the regions is significantly reduced. Experimental results on the PASCAL VOC 2007 dataset show that the proposed TCR significantly improves the baseline approach by increasing AUC (area under recall curve) from 0.39 to 0.48. It also outperforms the state-of-the-art with AUC and uses fewer detection proposals to achieve comparable recall rates.

Original languageEnglish
Title of host publicationProceedings - 29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016
PublisherIEEE Computer Society
Pages1083-1091
Number of pages9
ISBN (Electronic)9781467388504
DOIs
StatePublished - 16 Dec 2016
Externally publishedYes
Event29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016 - Las Vegas, United States
Duration: 26 Jun 20161 Jul 2016

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016
Country/TerritoryUnited States
CityLas Vegas
Period26/06/161/07/16

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