Abstract
We studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400-600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrate, indicating a violent reaction between the In and GaAs. This reaction became more violent with increasing temperature. Characterizing the generated phases by X-ray diffraction and transmission electron microscopy, we identified the particles as InxGa1-xAs compounds. Our results show that indium (In) reacted with single-crystal GaAs through this method to form InxGa1-xAs compounds. Moreover, during the synthesis of InxGa1-xAs by the sessile drop method, the molten In and GaAs exhibited wettability at 400-600 °C. This experiment lays the foundation for synthesizing InxGa1-xAs compounds only using the metal In and GaAs substrate by a simple method.
| Original language | English |
|---|---|
| Article number | 065003 |
| Journal | AIP Advances |
| Volume | 7 |
| Issue number | 6 |
| DOIs | |
| State | Published - 1 Jun 2017 |