Abstract
A new 3-D profilometry-symmetric linearly coded profilometry (SLCP) is put forward. it adopts a symmetrical periodic linear structured light to code the measured object surface and phase shifting technique is used to decode profile, so the phase solving is simple. The principle of SLCP is discussed in detail and its feasibility is demonstrated through experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 37-41 |
| Number of pages | 5 |
| Journal | Guangdian Gongcheng/Opto-Electronic Engineering |
| Volume | 26 |
| Issue number | 3 |
| State | Published - Jun 1999 |
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