Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF6/N2 Mixtures

Ke Feng Li; Yan Qin Liu; Xiao Feng Fan; Xiang Yu Liu; Jian Yi Xue; Jun Bo Deng; Guan Jun Zhang

doi:10.1109/ICHVE.2018.8642019

Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures

Ke Feng Li
, Yan Qin Liu
, Xiao Feng Fan
, Xiang Yu Liu
, Jian Yi Xue
, Jun Bo Deng
, Guan Jun Zhang

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The accumulated charge on insulator surface is an important factor to trigger surface flashover. A surface charge experimental setup as well as measurement system under high gas pressure is built. An active electrostatic probe (Trek 3455ET, Model 341B) is used to measure surface potential distribution on a downsized cone-type spacer in SF₆/N₂ mixtures of different pressure under DC voltage. The actual charge density distribution is computed by the charge inverse algorithm, which considers the impact of the probe. The surface charge distribution shows similar shape at different pressure, including the homo-charges presenting a symmetrical distribution and a streak-like distribution. For the home-charges presenting a symmetrical distribution, they come from surface conductivity. For the streak-like distribution, they are located between central and grounded electrode. These charges come from the ionization of SF₆ due to the local electrical field concentrated.

Original language	English
Title of host publication	ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538650868
DOIs	https://doi.org/10.1109/ICHVE.2018.8642019
State	Published - 2 Jul 2018
Event	2018 IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018 - Athens, Greece Duration: 10 Sep 2018 → 13 Sep 2018

Publication series

Name	ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application

Conference

Conference	2018 IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018
Country/Territory	Greece
City	Athens
Period	10/09/18 → 13/09/18

Access to Document

10.1109/ICHVE.2018.8642019

Cite this

Li, K. F., Liu, Y. Q., Fan, X. F., Liu, X. Y., Xue, J. Y., Deng, J. B., & Zhang, G. J. (2018). Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures. In ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application Article 8642019 (ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICHVE.2018.8642019

Li, Ke Feng ; Liu, Yan Qin ; Fan, Xiao Feng et al. / Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures. ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc., 2018. (ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application).

@inproceedings{66ca9e1f50ce4fe186a07b1f5f07d766,

title = "Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF6/N2 Mixtures",

abstract = "The accumulated charge on insulator surface is an important factor to trigger surface flashover. A surface charge experimental setup as well as measurement system under high gas pressure is built. An active electrostatic probe (Trek 3455ET, Model 341B) is used to measure surface potential distribution on a downsized cone-type spacer in SF6/N2 mixtures of different pressure under DC voltage. The actual charge density distribution is computed by the charge inverse algorithm, which considers the impact of the probe. The surface charge distribution shows similar shape at different pressure, including the homo-charges presenting a symmetrical distribution and a streak-like distribution. For the home-charges presenting a symmetrical distribution, they come from surface conductivity. For the streak-like distribution, they are located between central and grounded electrode. These charges come from the ionization of SF6 due to the local electrical field concentrated.",

author = "Li, \{Ke Feng\} and Liu, \{Yan Qin\} and Fan, \{Xiao Feng\} and Liu, \{Xiang Yu\} and Xue, \{Jian Yi\} and Deng, \{Jun Bo\} and Zhang, \{Guan Jun\}",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018 ; Conference date: 10-09-2018 Through 13-09-2018",

year = "2018",

month = jul,

day = "2",

doi = "10.1109/ICHVE.2018.8642019",

language = "英语",

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booktitle = "ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application",

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Li, KF, Liu, YQ, Fan, XF, Liu, XY, Xue, JY, Deng, JB & Zhang, GJ 2018, Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures. in ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application., 8642019, ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application, Institute of Electrical and Electronics Engineers Inc., 2018 IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018, Athens, Greece, 10/09/18. https://doi.org/10.1109/ICHVE.2018.8642019

Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures. / Li, Ke Feng; Liu, Yan Qin; Fan, Xiao Feng et al.
ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc., 2018. 8642019 (ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Deng, Jun Bo

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N2 - The accumulated charge on insulator surface is an important factor to trigger surface flashover. A surface charge experimental setup as well as measurement system under high gas pressure is built. An active electrostatic probe (Trek 3455ET, Model 341B) is used to measure surface potential distribution on a downsized cone-type spacer in SF6/N2 mixtures of different pressure under DC voltage. The actual charge density distribution is computed by the charge inverse algorithm, which considers the impact of the probe. The surface charge distribution shows similar shape at different pressure, including the homo-charges presenting a symmetrical distribution and a streak-like distribution. For the home-charges presenting a symmetrical distribution, they come from surface conductivity. For the streak-like distribution, they are located between central and grounded electrode. These charges come from the ionization of SF6 due to the local electrical field concentrated.

AB - The accumulated charge on insulator surface is an important factor to trigger surface flashover. A surface charge experimental setup as well as measurement system under high gas pressure is built. An active electrostatic probe (Trek 3455ET, Model 341B) is used to measure surface potential distribution on a downsized cone-type spacer in SF6/N2 mixtures of different pressure under DC voltage. The actual charge density distribution is computed by the charge inverse algorithm, which considers the impact of the probe. The surface charge distribution shows similar shape at different pressure, including the homo-charges presenting a symmetrical distribution and a streak-like distribution. For the home-charges presenting a symmetrical distribution, they come from surface conductivity. For the streak-like distribution, they are located between central and grounded electrode. These charges come from the ionization of SF6 due to the local electrical field concentrated.

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Li KF, Liu YQ, Fan XF, Liu XY, Xue JY, Deng JB et al. Surface Charge Accumulation Behavior on GIL Spacer under DC Voltages in SF₆/N₂ Mixtures. In ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc. 2018. 8642019. (ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application). doi: 10.1109/ICHVE.2018.8642019