Study on the trap distribution in polyimide thin film based on TSDC method

Chun Yang; Ying Zhang; Lijuan He; Yucui Xue; Fuqiang Tian; Xiuchen Jiang; Qingquan Lei

doi:10.1109/ICPADM.2009.5252244

Study on the trap distribution in polyimide thin film based on TSDC method

Chun Yang
, Ying Zhang
, Lijuan He
, Yucui Xue
, Fuqiang Tian
, Xiuchen Jiang
, Qingquan Lei

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

Electron traps in polyimide (PI) film were investigated by analyses of thermally stimulated depolarization current (TSDC). A broad αpeak of TDSC was observed around 459K in PI which was ascribed to the rel ease of space charge. Then we estimated electron trap levels in polyimide based on the theory of Simmons and found their distributed by Gaussian distribution in the range of0.45∼0.90eV. And compare the trap distributions of PI-Si0₂ and PI-AI₂0₃ nano-composite films, give a picture of nano-particle effected on the properties of polymeric dielectric.

Original language	English
Title of host publication	2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009
Pages	911-913
Number of pages	3
DOIs	https://doi.org/10.1109/ICPADM.2009.5252244
State	Published - 2009
Externally published	Yes
Event	2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009 - Harbin, China Duration: 19 Jul 2009 → 23 Jul 2009

Publication series

Name	Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Conference

Conference	2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009
Country/Territory	China
City	Harbin
Period	19/07/09 → 23/07/09

Keywords

Dielectric
Nano- composite
Polymeric thin film
Trap distribution

Access to Document

10.1109/ICPADM.2009.5252244

Cite this

Yang, C., Zhang, Y., He, L., Xue, Y., Tian, F., Jiang, X., & Lei, Q. (2009). Study on the trap distribution in polyimide thin film based on TSDC method. In 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009 (pp. 911-913). Article 5252244 (Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials). https://doi.org/10.1109/ICPADM.2009.5252244

@inproceedings{72358daa8e89477789deda8ac71583cf,

title = "Study on the trap distribution in polyimide thin film based on TSDC method",

abstract = "Electron traps in polyimide (PI) film were investigated by analyses of thermally stimulated depolarization current (TSDC). A broad αpeak of TDSC was observed around 459K in PI which was ascribed to the rel ease of space charge. Then we estimated electron trap levels in polyimide based on the theory of Simmons and found their distributed by Gaussian distribution in the range of0.45∼0.90eV. And compare the trap distributions of PI-Si02 and PI-AI203 nano-composite films, give a picture of nano-particle effected on the properties of polymeric dielectric.",

keywords = "Dielectric, Nano- composite, Polymeric thin film, Trap distribution",

author = "Chun Yang and Ying Zhang and Lijuan He and Yucui Xue and Fuqiang Tian and Xiuchen Jiang and Qingquan Lei",

year = "2009",

doi = "10.1109/ICPADM.2009.5252244",

language = "英语",

isbn = "9781424443680",

series = "Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials",

pages = "911--913",

booktitle = "2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009",

note = "2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009 ; Conference date: 19-07-2009 Through 23-07-2009",

}

Yang, C, Zhang, Y, He, L, Xue, Y, Tian, F, Jiang, X & Lei, Q 2009, Study on the trap distribution in polyimide thin film based on TSDC method. in 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009., 5252244, Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials, pp. 911-913, 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009, Harbin, China, 19/07/09. https://doi.org/10.1109/ICPADM.2009.5252244

Study on the trap distribution in polyimide thin film based on TSDC method. / Yang, Chun; Zhang, Ying; He, Lijuan et al.
2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009. 2009. p. 911-913 5252244 (Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Study on the trap distribution in polyimide thin film based on TSDC method

AU - Yang, Chun

AU - Zhang, Ying

AU - He, Lijuan

AU - Xue, Yucui

AU - Tian, Fuqiang

AU - Jiang, Xiuchen

AU - Lei, Qingquan

PY - 2009

Y1 - 2009

N2 - Electron traps in polyimide (PI) film were investigated by analyses of thermally stimulated depolarization current (TSDC). A broad αpeak of TDSC was observed around 459K in PI which was ascribed to the rel ease of space charge. Then we estimated electron trap levels in polyimide based on the theory of Simmons and found their distributed by Gaussian distribution in the range of0.45∼0.90eV. And compare the trap distributions of PI-Si02 and PI-AI203 nano-composite films, give a picture of nano-particle effected on the properties of polymeric dielectric.

AB - Electron traps in polyimide (PI) film were investigated by analyses of thermally stimulated depolarization current (TSDC). A broad αpeak of TDSC was observed around 459K in PI which was ascribed to the rel ease of space charge. Then we estimated electron trap levels in polyimide based on the theory of Simmons and found their distributed by Gaussian distribution in the range of0.45∼0.90eV. And compare the trap distributions of PI-Si02 and PI-AI203 nano-composite films, give a picture of nano-particle effected on the properties of polymeric dielectric.

KW - Dielectric

KW - Nano- composite

KW - Polymeric thin film

KW - Trap distribution

UR - https://www.scopus.com/pages/publications/71049191520

U2 - 10.1109/ICPADM.2009.5252244

DO - 10.1109/ICPADM.2009.5252244

M3 - 会议稿件

AN - SCOPUS:71049191520

SN - 9781424443680

T3 - Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

SP - 911

EP - 913

BT - 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009

T2 - 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009

Y2 - 19 July 2009 through 23 July 2009

ER -

Yang C, Zhang Y, He L, Xue Y, Tian F, Jiang X et al. Study on the trap distribution in polyimide thin film based on TSDC method. In 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2009. 2009. p. 911-913. 5252244. (Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials). doi: 10.1109/ICPADM.2009.5252244

Study on the trap distribution in polyimide thin film based on TSDC method

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this