Abstract
A testing apparatus for voltage endurance of film materials subjected to partial discharges on its surface was developed according to IEC-343 and ASTM-2275. It consists of electrode unit, power supply unit and control unit, and has the function of testing simultaneously six group samples. The single chip computer is used to time and to switch off the circuit in which the sample is breakdown. The EEPROM is used to record the results. The corona-resistance of polyimide film before and after compound with nano-inorganic oxide is tested and the influence of the component and content on corona-resistance of material is researched. The Cp-ω and tg δ-ω of samples both before and after corona aging are first studied by HP 4294A and the surface morphology characterized by AFM.
| Original language | English |
|---|---|
| Pages | 1138-1141 |
| Number of pages | 4 |
| State | Published - 2003 |
| Externally published | Yes |
| Event | Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials - Nagoya, Japan Duration: 1 Jun 2003 → 5 Jun 2003 |
Conference
| Conference | Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials |
|---|---|
| Country/Territory | Japan |
| City | Nagoya |
| Period | 1/06/03 → 5/06/03 |
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