Structures and tunability of Ba0.5Sr0.5TiO 3/Bi1.5Zn1.0Nb1.5O7 multilayer thin films grown on Pt/Al2O3 substrates

Xin Yan; Wei Ren; Peng Shi; Xiaoqing Wu; Xiaofeng Chen; Xi Yao

doi:10.1080/00150190902892980

Structures and tunability of Ba_0.5Sr_0.5TiO ₃/Bi_1.5Zn_1.0Nb_1.5O₇ multilayer thin films grown on Pt/Al₂O₃ substrates

Xin Yan
, Wei Ren
, Peng Shi
, Xiaoqing Wu
, Xiaofeng Chen
, Xi Yao

Faculty of Electronic and Information Engineering

Xi'an Jiaotong University

Research output: Contribution to journal › Conference article › peer-review

Abstract

Ba0.5Sr0.5TiO3 (BST) /Bi1.5Zn1.0Nb1.5O7 (BZN) multilayer thin films have been prepared on Pt/Al2O3 substrates by a sol-gel method. The multilayer thin films were deposited alternatively by spin coating technique and crystallized by rapid thermal annealing. The structures and morphologies of BST/BZN multilayer thin films were analyzed by XRD and FESEM. The XRD results showed that the perovskite BST phase and the cubic pyrochlore BZN phase can be observed respectively in the multilayer thin films annealed at 700-800°C. The morphology of BST/BZN multilayer films shows that the films are crack-free and have distinct interfaces. The BST/BZN multilayer thin films annealed at 750°C exhibit a moderate dielectric constant around 69, a low loss tangent of 0.007, and a relative tunability of 21% at bias field of 450 kV/cm at 10kHz.

Original language	English
Pages (from-to)	98-105
Number of pages	8
Journal	Ferroelectrics
Volume	384
Issue number	1 PART 5
DOIs	https://doi.org/10.1080/00150190902892980
State	Published - 2009
Event	6th Asian Meeting on Ferroelectrics, AMF-6 - Taipei, Taiwan, Province of China Duration: 2 Aug 2008 → 6 Aug 2008

Keywords

Dielectrics
Sol-gel process
Thin films
Tunability

Access to Document

10.1080/00150190902892980

Cite this

@article{f1bf17106fde4628b1094eed98abc4e1,

title = "Structures and tunability of Ba0.5Sr0.5TiO 3/Bi1.5Zn1.0Nb1.5O7 multilayer thin films grown on Pt/Al2O3 substrates",

abstract = "Ba0.5Sr0.5TiO3 (BST) /Bi1.5Zn1.0Nb1.5O7 (BZN) multilayer thin films have been prepared on Pt/Al2O3 substrates by a sol-gel method. The multilayer thin films were deposited alternatively by spin coating technique and crystallized by rapid thermal annealing. The structures and morphologies of BST/BZN multilayer thin films were analyzed by XRD and FESEM. The XRD results showed that the perovskite BST phase and the cubic pyrochlore BZN phase can be observed respectively in the multilayer thin films annealed at 700-800°C. The morphology of BST/BZN multilayer films shows that the films are crack-free and have distinct interfaces. The BST/BZN multilayer thin films annealed at 750°C exhibit a moderate dielectric constant around 69, a low loss tangent of 0.007, and a relative tunability of 21\% at bias field of 450 kV/cm at 10kHz.",

keywords = "Dielectrics, Sol-gel process, Thin films, Tunability",

author = "Xin Yan and Wei Ren and Peng Shi and Xiaoqing Wu and Xiaofeng Chen and Xi Yao",

year = "2009",

doi = "10.1080/00150190902892980",

language = "英语",

volume = "384",

pages = "98--105",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1 PART 5",

note = "6th Asian Meeting on Ferroelectrics, AMF-6 ; Conference date: 02-08-2008 Through 06-08-2008",

}

TY - JOUR

T1 - Structures and tunability of Ba0.5Sr0.5TiO 3/Bi1.5Zn1.0Nb1.5O7 multilayer thin films grown on Pt/Al2O3 substrates

AU - Yan, Xin

AU - Ren, Wei

AU - Shi, Peng

AU - Wu, Xiaoqing

AU - Chen, Xiaofeng

AU - Yao, Xi

PY - 2009

Y1 - 2009

N2 - Ba0.5Sr0.5TiO3 (BST) /Bi1.5Zn1.0Nb1.5O7 (BZN) multilayer thin films have been prepared on Pt/Al2O3 substrates by a sol-gel method. The multilayer thin films were deposited alternatively by spin coating technique and crystallized by rapid thermal annealing. The structures and morphologies of BST/BZN multilayer thin films were analyzed by XRD and FESEM. The XRD results showed that the perovskite BST phase and the cubic pyrochlore BZN phase can be observed respectively in the multilayer thin films annealed at 700-800°C. The morphology of BST/BZN multilayer films shows that the films are crack-free and have distinct interfaces. The BST/BZN multilayer thin films annealed at 750°C exhibit a moderate dielectric constant around 69, a low loss tangent of 0.007, and a relative tunability of 21% at bias field of 450 kV/cm at 10kHz.

AB - Ba0.5Sr0.5TiO3 (BST) /Bi1.5Zn1.0Nb1.5O7 (BZN) multilayer thin films have been prepared on Pt/Al2O3 substrates by a sol-gel method. The multilayer thin films were deposited alternatively by spin coating technique and crystallized by rapid thermal annealing. The structures and morphologies of BST/BZN multilayer thin films were analyzed by XRD and FESEM. The XRD results showed that the perovskite BST phase and the cubic pyrochlore BZN phase can be observed respectively in the multilayer thin films annealed at 700-800°C. The morphology of BST/BZN multilayer films shows that the films are crack-free and have distinct interfaces. The BST/BZN multilayer thin films annealed at 750°C exhibit a moderate dielectric constant around 69, a low loss tangent of 0.007, and a relative tunability of 21% at bias field of 450 kV/cm at 10kHz.

KW - Dielectrics

KW - Sol-gel process

KW - Thin films

KW - Tunability

UR - https://www.scopus.com/pages/publications/77749304211

U2 - 10.1080/00150190902892980

DO - 10.1080/00150190902892980

M3 - 会议文章

AN - SCOPUS:77749304211

SN - 0015-0193

VL - 384

SP - 98

EP - 105

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1 PART 5

T2 - 6th Asian Meeting on Ferroelectrics, AMF-6

Y2 - 2 August 2008 through 6 August 2008

ER -

Structures and tunability of Ba_0.5Sr_0.5TiO ₃/Bi_1.5Zn_1.0Nb_1.5O₇ multilayer thin films grown on Pt/Al₂O₃ substrates

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this