Abstract
Doped Bi2O3-ZnO-Nb2O5 (BZN) cubic pyrochlore thin films are prepared on Pt/Ti/SiO2/Si(100) substrates by pulsed laser deposition process. Dielectric properties of BZN thin films can be tailored by doping. The thin films of pure BZN and BZN doped by Ti and Ca, as well as the BZN thin films with excessive Bi2O3 and/or ZnO have been prepared. The structure, crystallinity and dielectric properties have been investigated. It's found that excessive Bi2O3 and ZnO increase dielectric constant and also loss tangent. For the doped BZN thin films, A-site Ca-substitution (Bi1.5Zn0.1Ca0.4)Nb1.5O7 films exhibit small dielectric constant of 129, while B-site Ti-substitution (Bi1.5Zn0.5) (Nb0.5Ti1.5)O7 thin films exhibit larger dielectric constant of 226.
| Original language | English |
|---|---|
| Pages (from-to) | 87-91 |
| Number of pages | 5 |
| Journal | Ferroelectrics |
| Volume | 381 |
| Issue number | 1 PART 2 |
| DOIs | |
| State | Published - 2009 |
| Event | 6th Asian Meeting on Ferroelectrics, AMF-6 - Taipei, Taiwan, Province of China Duration: 2 Aug 2008 → 6 Aug 2008 |
Keywords
- Cubic pyrochlore structure
- Dielectric property
- Doped BZN thin films
- Pulsed laser deposition
- Tunability