TY - JOUR
T1 - Structures and electric properties of cubic bismuth based pyrochlore thin films grown by pulsed laser deposition
AU - Zhang, Xiaohua
AU - Ren, Wei
AU - Xin, Feng
AU - Shi, Peng
PY - 2014/11/25
Y1 - 2014/11/25
N2 - The effects of cation substitution on the structure, dielectric properties, tunability, and temperature dependence of (Bi1.5Zn 0.5)(Zn0.5Nb1.5)O7 (BZN) thin films were investigated. Four kinds of ceramic targets and thin films were prepared, which were (Bi1.5Zn0.1Ca0.4)(Zn 0.5Nb1.5)O7 (BZNCa), (Bi1.5Zn 0.5)(Nb0.5Ti1.5)O7 (BZNTi), (Bi 1.5Sr0.5)(Sn1.5Nb0.5)O7 (BSSN) and (Bi1.5Sr0.5)(Zr1.5Nb 0.5)O7 (BSZN). Thin films were deposited on Pt/TiO 2/SiO2/Si(1 0 0) substrates at the substrate temperature of 650 °C under an oxygen pressure of 10 Pa by pulsed laser deposition. The resultant Bi-based thin films show a cubic pyrochlore structure. Meanwhile, the preferential orientation of the (1 1 1) plane is observed. Surface morphology features of the substituted thin films also show the difference. Compared with the pure BZN thin film, the dielectric constant of the BZNCa thin film slightly decreases. The temperature coefficient of capacitance (TCC) moves to the negative orientation TCC = -319 ppm/°C. The dielectric constant of the BZNTi thin film significantly increases, reaching 229. At the same time, thin film still keeps the low loss tangent. However, the dielectric constants of the BSSN and BSZN thin films significantly decrease, dropping to 60 and 48, respectively. Furthermore the BSSN thin film exhibits the near zero temperature coefficient of + 55 ppm/°C. The BSZN thin film also shows the positive TCC value of + 318 ppm/°C. Moreover, BSSN and BSZN thin films show a near field independence (at low field).
AB - The effects of cation substitution on the structure, dielectric properties, tunability, and temperature dependence of (Bi1.5Zn 0.5)(Zn0.5Nb1.5)O7 (BZN) thin films were investigated. Four kinds of ceramic targets and thin films were prepared, which were (Bi1.5Zn0.1Ca0.4)(Zn 0.5Nb1.5)O7 (BZNCa), (Bi1.5Zn 0.5)(Nb0.5Ti1.5)O7 (BZNTi), (Bi 1.5Sr0.5)(Sn1.5Nb0.5)O7 (BSSN) and (Bi1.5Sr0.5)(Zr1.5Nb 0.5)O7 (BSZN). Thin films were deposited on Pt/TiO 2/SiO2/Si(1 0 0) substrates at the substrate temperature of 650 °C under an oxygen pressure of 10 Pa by pulsed laser deposition. The resultant Bi-based thin films show a cubic pyrochlore structure. Meanwhile, the preferential orientation of the (1 1 1) plane is observed. Surface morphology features of the substituted thin films also show the difference. Compared with the pure BZN thin film, the dielectric constant of the BZNCa thin film slightly decreases. The temperature coefficient of capacitance (TCC) moves to the negative orientation TCC = -319 ppm/°C. The dielectric constant of the BZNTi thin film significantly increases, reaching 229. At the same time, thin film still keeps the low loss tangent. However, the dielectric constants of the BSSN and BSZN thin films significantly decrease, dropping to 60 and 48, respectively. Furthermore the BSSN thin film exhibits the near zero temperature coefficient of + 55 ppm/°C. The BSZN thin film also shows the positive TCC value of + 318 ppm/°C. Moreover, BSSN and BSZN thin films show a near field independence (at low field).
KW - Bismuth based pyrochlore
KW - Dielectric properties
KW - Pulsed laser deposition
KW - Thin films
UR - https://www.scopus.com/pages/publications/84903995172
U2 - 10.1016/j.jallcom.2014.06.044
DO - 10.1016/j.jallcom.2014.06.044
M3 - 文章
AN - SCOPUS:84903995172
SN - 0925-8388
VL - 614
SP - 80
EP - 86
JO - Journal of Alloys and Compounds
JF - Journal of Alloys and Compounds
ER -