Skip to main navigation Skip to search Skip to main content

Structure, phase evolution, and microwave dielectric properties of (Ag 0.5Bi0.5)(Mo0.5W0.5)O4 ceramic with ultralow sintering temperature

  • Di Zhou
  • , Wen Bo Li
  • , Jing Guo
  • , Li Xia Pang
  • , Ze Ming Qi
  • , Tao Shao
  • , Hui Dong Xie
  • , Zhen Xing Yue
  • , Xi Yao
  • Xi'an Jiaotong University
  • Xi'an Technological University
  • University of Science and Technology of China
  • Xi'an University of Architecture and Technology
  • Tsinghua University

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

In the present work, the microwave dielectric ceramic (Ag 0.5Bi0.5)(Mo0.5W0.5)O4 was prepared by using the solid-state reaction method. (Ag0.5Bi 0.5)(Mo0.5W0.5)O4 was found to crystallize in the scheelite structure, in which Ag+ and Bi 3+ occupy the A site randomly with 8-coordination while Mo 6+ and W6+ occupy the B site with 4-coordination, at a sintering temperature above 500 °C, with lattice parameters a = b = 5.29469(2) Å and c = 11.62114(0) Å, space group I41/a (No. 88), and acceptable Rp = 9.38, Rwp = 11.2, and R exp = 5.86. High-performance microwave dielectric properties, with permittivity 26.3, Qf value 10000 GHz, and temperature coefficient +20 ppm/°C, were obtained in the sample sintered at 580 °C. Its chemical compatibility with aluminum at its sintering temperature was revealed and confirmed by both X-ray and energy dispersive spectrometer analysis. This ceramic could be a good candidate for ultralow-temperature cofired ceramics.

Original languageEnglish
Pages (from-to)5712-5716
Number of pages5
JournalInorganic Chemistry
Volume53
Issue number11
DOIs
StatePublished - 2 Jun 2014

Fingerprint

Dive into the research topics of 'Structure, phase evolution, and microwave dielectric properties of (Ag 0.5Bi0.5)(Mo0.5W0.5)O4 ceramic with ultralow sintering temperature'. Together they form a unique fingerprint.

Cite this