Structure and dielectric properties of (Sr1-1.5xBi x)TiO3 thin films

Shi Peng; Ren Wei; Zhao Min; Wei Xiaoyong; Wu Xiaoqing; Chen Xiaofeng; Yao Xi

doi:10.1109/ISAF.2008.4693858

Structure and dielectric properties of (Sr_1-1.5xBi _x)TiO₃ thin films

Shi Peng
, Ren Wei
, Zhao Min
, Wei Xiaoyong
, Wu Xiaoqing
, Chen Xiaofeng
, Yao Xi

Faculty of Electronic and Information Engineering

Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
DOIs	https://doi.org/10.1109/ISAF.2008.4693858
State	Published - 2008
Event	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 - Santa Fe, NM, United States Duration: 23 Feb 2008 → 28 Feb 2008

Publication series

Name	IEEE International Symposium on Applications of Ferroelectrics
Volume	2

Conference

Conference	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
Country/Territory	United States
City	Santa Fe, NM
Period	23/02/08 → 28/02/08

Access to Document

10.1109/ISAF.2008.4693858

Cite this

Peng, S., Wei, R., Min, Z., Xiaoyong, W., Xiaoqing, W., Xiaofeng, C., & Xi, Y. (2008). Structure and dielectric properties of (Sr_1-1.5xBi _x)TiO₃ thin films. In 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 Article 4693858 (IEEE International Symposium on Applications of Ferroelectrics; Vol. 2). https://doi.org/10.1109/ISAF.2008.4693858

@inproceedings{85e431b4c4924070affc007873492e1a,

title = "Structure and dielectric properties of (Sr1-1.5xBi x)TiO3 thin films",

author = "Shi Peng and Ren Wei and Zhao Min and Wei Xiaoyong and Wu Xiaoqing and Chen Xiaofeng and Yao Xi",

year = "2008",

doi = "10.1109/ISAF.2008.4693858",

language = "英语",

isbn = "1424427444",

series = "IEEE International Symposium on Applications of Ferroelectrics",

booktitle = "17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008",

note = "17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 ; Conference date: 23-02-2008 Through 28-02-2008",

}

Peng, S , Wei, R, Min, Z, Xiaoyong, W, Xiaoqing, W, Xiaofeng, C & Xi, Y 2008, Structure and dielectric properties of (Sr_1-1.5xBi _x)TiO₃ thin films. in 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008., 4693858, IEEE International Symposium on Applications of Ferroelectrics, vol. 2, 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008, Santa Fe, NM, United States, 23/02/08. https://doi.org/10.1109/ISAF.2008.4693858

Structure and dielectric properties of (Sr_1-1.5xBi _x)TiO₃ thin films. / Peng, Shi ; Wei, Ren; Min, Zhao et al.
17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008. 2008. 4693858 (IEEE International Symposium on Applications of Ferroelectrics; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Structure and dielectric properties of (Sr1-1.5xBi x)TiO3 thin films

AU - Peng, Shi

AU - Wei, Ren

AU - Min, Zhao

AU - Xiaoyong, Wei

AU - Xiaoqing, Wu

AU - Xiaofeng, Chen

AU - Xi, Yao

PY - 2008

Y1 - 2008

UR - https://www.scopus.com/pages/publications/58149501119

U2 - 10.1109/ISAF.2008.4693858

DO - 10.1109/ISAF.2008.4693858

M3 - 会议稿件

AN - SCOPUS:58149501119

SN - 1424427444

SN - 9781424427444

T3 - IEEE International Symposium on Applications of Ferroelectrics

BT - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

T2 - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

Y2 - 23 February 2008 through 28 February 2008