Statistical Reliability Analysis and Lifetime Prediction for Magnetoelectric Sensors

Magnetoelectric (ME) sensors have attracted considerable attention and are utilized in diverse fields due to their high sensitivity, low cost, and ease of miniaturization. However, the reliability and the service lifetime of the mechanically resonant ME sensors are unclear, which are critical for their practical implementation. In this study, a lifetime prediction for ME sensors composed of a sandwich structure with Metglas and quartz single crystals is conducted. The failure process of the sensors is accelerated by applying high magnetic fields and high-temperature environments under resonant conditions. Combining the inverse power-law model and Arrhenius model with the Weibull distribution, the service lifetime of ME sensors under normal operating conditions could be over 40 000 h. The underlying failure mechanism is further analyzed, providing significant guidance for the lifetime assessment and the applications of ME sensors.