Skip to main navigation Skip to search Skip to main content

Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV

  • Xin Zhang
  • , Gaoyang Li
  • , Ronghui Huang
  • , Zhen Xiang
  • , Yuming Zhang
  • , Senjing Yao
  • , Xiaohua Wang
  • Shenzhen Power Supply Corporation
  • Xi'an Jiaotong University

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

The defect rate of gas insulted switchgear (GIS) usually increases along with its operating years. According to statistical analysis of defect rate of GIS in different life period, and the similar analysis for its components respectively, including the control system, seal ring and mechanism, the growth rule of different kind of defects is revealed. Moreover, some maintenance advice for GIS of different lifetime is also proposed.

Original languageEnglish
Pages (from-to)184-188 and 194
JournalGaoya Dianqi/High Voltage Apparatus
Volume52
Issue number3
DOIs
StatePublished - 16 Mar 2016

Keywords

  • Control system
  • Defect rate
  • Gas insulted switchgear (GIS)
  • Mechanism
  • Operating year
  • Seal

Fingerprint

Dive into the research topics of 'Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV'. Together they form a unique fingerprint.

Cite this