Spread of critical currents in thin-film YBa2Cu3O7-x bicrystal junctions and faceting of grain boundary

P. Shadrin; C. L. Jia; Y. Divin

doi:10.1016/S0921-4534(02)00786-4

Spread of critical currents in thin-film YBa₂Cu₃O_7-x bicrystal junctions and faceting of grain boundary

P. Shadrin
, C. L. Jia
, Y. Divin

Jülich Research Centre

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A spread of the critical currents in a series array of 100 YBa₂Cu₃O_7-x bicrystal junctions has been studied by laser scanning microscopy. The values of the critical current I_c of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current through the array at which the maximum laser-induced voltage response has appeared on the array. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The I_c-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array.

Original language	English
Pages (from-to)	80-82
Number of pages	3
Journal	Physica C: Superconductivity and its applications
Volume	372-376
Issue number	PART 1
DOIs	https://doi.org/10.1016/S0921-4534(02)00786-4
State	Published - Aug 2002
Externally published	Yes

Keywords

Grain boundary
Josephson junction
Spread of critical current

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10.1016/S0921-4534(02)00786-4

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title = "Spread of critical currents in thin-film YBa2Cu3O7-x bicrystal junctions and faceting of grain boundary",

abstract = "A spread of the critical currents in a series array of 100 YBa2Cu3O7-x bicrystal junctions has been studied by laser scanning microscopy. The values of the critical current Ic of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current through the array at which the maximum laser-induced voltage response has appeared on the array. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The Ic-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array.",

keywords = "Grain boundary, Josephson junction, Spread of critical current",

author = "P. Shadrin and Jia, \{C. L.\} and Y. Divin",

year = "2002",

month = aug,

doi = "10.1016/S0921-4534(02)00786-4",

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volume = "372-376",

pages = "80--82",

journal = "Physica C: Superconductivity and its applications",

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T1 - Spread of critical currents in thin-film YBa2Cu3O7-x bicrystal junctions and faceting of grain boundary

AU - Shadrin, P.

AU - Jia, C. L.

AU - Divin, Y.

PY - 2002/8

Y1 - 2002/8

N2 - A spread of the critical currents in a series array of 100 YBa2Cu3O7-x bicrystal junctions has been studied by laser scanning microscopy. The values of the critical current Ic of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current through the array at which the maximum laser-induced voltage response has appeared on the array. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The Ic-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array.

AB - A spread of the critical currents in a series array of 100 YBa2Cu3O7-x bicrystal junctions has been studied by laser scanning microscopy. The values of the critical current Ic of individual junctions in the array have been obtained by focusing a laser beam on each junction and measuring the current through the array at which the maximum laser-induced voltage response has appeared on the array. The distribution of critical currents in logarithmic scale was close to a Gaussian one. The Ic-spread has been found to increase with the increase of misorientation angle of bicrystal substrate and the decrease of the width of the junctions in the array.

KW - Grain boundary

KW - Josephson junction

KW - Spread of critical current

UR - https://www.scopus.com/pages/publications/0036682909

U2 - 10.1016/S0921-4534(02)00786-4

DO - 10.1016/S0921-4534(02)00786-4

M3 - 文章

AN - SCOPUS:0036682909

SN - 0921-4534

VL - 372-376

SP - 80

EP - 82

JO - Physica C: Superconductivity and its applications

JF - Physica C: Superconductivity and its applications

IS - PART 1

ER -

Spread of critical currents in thin-film YBa₂Cu₃O_7-x bicrystal junctions and faceting of grain boundary

Abstract

Keywords

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