Single-path electro-optic coefficients measurement approach using multiple reflection interference

Weigang Zhao; Hui Chen; Xiaotian Fu; Fusheng Qiu; Xiaoyong Wei; Zhuo Xu

doi:10.1364/AO.441951

Single-path electro-optic coefficients measurement approach using multiple reflection interference

Weigang Zhao
, Hui Chen
, Xiaotian Fu
, Fusheng Qiu
, Xiaoyong Wei
, Zhuo Xu

Faculty of Electronic and Information Engineering

Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved. The signedEOCsof a congruent LiNbO3 crystalwere determined under a small external electric field as γ31 = +9.6 ± 0.3 pm/V and γ33 = +29.5 ± 0.5 pm/V. This study may contribute to the development of potential anisotropic devices of optical crystals.

Original language	English
Pages (from-to)	10372-10376
Number of pages	5
Journal	Applied Optics
Volume	60
Issue number	33
DOIs	https://doi.org/10.1364/AO.441951
State	Published - 20 Nov 2021

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10.1364/AO.441951

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title = "Single-path electro-optic coefficients measurement approach using multiple reflection interference",

abstract = "An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved. The signedEOCsof a congruent LiNbO3 crystalwere determined under a small external electric field as γ31 = +9.6 ± 0.3 pm/V and γ33 = +29.5 ± 0.5 pm/V. This study may contribute to the development of potential anisotropic devices of optical crystals.",

author = "Weigang Zhao and Hui Chen and Xiaotian Fu and Fusheng Qiu and Xiaoyong Wei and Zhuo Xu",

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month = nov,

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doi = "10.1364/AO.441951",

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T1 - Single-path electro-optic coefficients measurement approach using multiple reflection interference

AU - Zhao, Weigang

AU - Chen, Hui

AU - Fu, Xiaotian

AU - Qiu, Fusheng

AU - Wei, Xiaoyong

AU - Xu, Zhuo

PY - 2021/11/20

Y1 - 2021/11/20

N2 - An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved. The signedEOCsof a congruent LiNbO3 crystalwere determined under a small external electric field as γ31 = +9.6 ± 0.3 pm/V and γ33 = +29.5 ± 0.5 pm/V. This study may contribute to the development of potential anisotropic devices of optical crystals.

AB - An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved. The signedEOCsof a congruent LiNbO3 crystalwere determined under a small external electric field as γ31 = +9.6 ± 0.3 pm/V and γ33 = +29.5 ± 0.5 pm/V. This study may contribute to the development of potential anisotropic devices of optical crystals.

UR - https://www.scopus.com/pages/publications/85119344787

U2 - 10.1364/AO.441951

DO - 10.1364/AO.441951

M3 - 文章

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SN - 1559-128X

VL - 60

SP - 10372

EP - 10376

JO - Applied Optics

JF - Applied Optics

IS - 33

ER -

Single-path electro-optic coefficients measurement approach using multiple reflection interference

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