TY - GEN
T1 - Simulation and analysis of cantilever-membrane structure for piezoresistive micro-accelerometers
AU - Liu, Yan
AU - Zhao, Yulong
AU - Sun, Lu
PY - 2012
Y1 - 2012
N2 - Dynamic and static performances are the most important parameters for accelerometers. The natural frequency decides the sensor's working frequency band, and the accompanying stress represents the measurement sensitivity. In this paper, a novel sensing structure, cantilever-membrane structure, for piezoresistive accelerometers is studied, in order to detect the structural dimension's effect on the sensor. With the help of FEM (Finite element method) software, the first order natural frequency of the cantilever-membrane based accelerometer is investigated with the different combinations of membrane's dimensions. The accompanying stress of the sensing structure is also simulated in this paper. The results show that the membrane's dimensions affect the frequency and stress more tempestuously when the membrane is short, but the tendency become gentle when the width of the membrane increases.
AB - Dynamic and static performances are the most important parameters for accelerometers. The natural frequency decides the sensor's working frequency band, and the accompanying stress represents the measurement sensitivity. In this paper, a novel sensing structure, cantilever-membrane structure, for piezoresistive accelerometers is studied, in order to detect the structural dimension's effect on the sensor. With the help of FEM (Finite element method) software, the first order natural frequency of the cantilever-membrane based accelerometer is investigated with the different combinations of membrane's dimensions. The accompanying stress of the sensing structure is also simulated in this paper. The results show that the membrane's dimensions affect the frequency and stress more tempestuously when the membrane is short, but the tendency become gentle when the width of the membrane increases.
KW - Cantilever-membrane Structure
KW - FEM
KW - Micro-accelerometers
KW - Piezoresistive effect
UR - https://www.scopus.com/pages/publications/84863126677
U2 - 10.4028/www.scientific.net/KEM.503.87
DO - 10.4028/www.scientific.net/KEM.503.87
M3 - 会议稿件
AN - SCOPUS:84863126677
SN - 9783037853641
T3 - Key Engineering Materials
SP - 87
EP - 90
BT - Micro-Nano Technology XIII
PB - Trans Tech Publications Ltd
T2 - 13th Annual Conference of Chinese Society of Micro-Nano Technology, CSMNT 2011
Y2 - 28 September 2011 through 30 September 2011
ER -