Simple sticking models and adhesion criterion to predict sticking effects of fixed-fixed beams in RF MEMS switch design

  • Yu Hui
  • , Kai Yang
  • , Binbin Jiao
  • , Yupeng Jing
  • , Dapeng Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The fixed-fixed beam in RF switches fabricated by MEMS techniques of a sacrificial layer is inclined to stick to the substrate due to the significant capillary force during drying process. In this paper, sticking models of the fixed-fixed beam are investigated to analyze the sticking effect. Based on these models, an adhesion criterion hc for the fixed-fixed beam is derived to determine whether the beam sticks to the substrate or not. The deduced formula shows that hc is determined by the material property of the beam and its length L and thickness t. It is also found that the width of the beam has no effect on hc. The theoretical models and adhesion criterion are simulated and verified by Finite Element Analysis. The effects of residual stress are also discussed to meet the uncertainty of real fabrication processes.

Original languageEnglish
Title of host publication2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
Pages997-1001
Number of pages5
DOIs
StatePublished - 2010
Externally publishedYes
Event5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010 - Xiamen, China
Duration: 20 Jan 201023 Jan 2010

Publication series

Name2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010

Conference

Conference5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
Country/TerritoryChina
CityXiamen
Period20/01/1023/01/10

Keywords

  • Fixed-fixed beam
  • MEMS
  • RF switch
  • Sticking effect

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