TY - GEN
T1 - Series Arc Fault Modelling in Photovoltaic Resistive Systems
AU - Chen, Silei
AU - Wang, Jing
AU - Li, Xingwen
N1 - Publisher Copyright:
© 2021 30th International Conference on Electrical Contacts. All rights reserved.
PY - 2021
Y1 - 2021
N2 - Series arc fault modelling provides an effective simulation approach for understanding arc fault characteristics in photovoltaic (PV) systems. However, the measured arc fault signals are synthetic results between arc faults and many system interference factors, which makes the modelling process complicated. This paper aims at providing an effective arc fault model for the simulation research in PV resistive systems. In this paper, various arc fault data are acquired through the designed experiment platform firstly. Then the establishment direction is summarized for the arc fault modelling in PV resistive systems. Next, the series arc fault model is proposed by combining the U-I model and pink noise model. Finally, the simulation analysis of series arc fault is carried out in PV resistive systems. By comparing with the obtained experimental data, the effectiveness of the arc fault model is verified.
AB - Series arc fault modelling provides an effective simulation approach for understanding arc fault characteristics in photovoltaic (PV) systems. However, the measured arc fault signals are synthetic results between arc faults and many system interference factors, which makes the modelling process complicated. This paper aims at providing an effective arc fault model for the simulation research in PV resistive systems. In this paper, various arc fault data are acquired through the designed experiment platform firstly. Then the establishment direction is summarized for the arc fault modelling in PV resistive systems. Next, the series arc fault model is proposed by combining the U-I model and pink noise model. Finally, the simulation analysis of series arc fault is carried out in PV resistive systems. By comparing with the obtained experimental data, the effectiveness of the arc fault model is verified.
UR - https://www.scopus.com/pages/publications/85135322799
M3 - 会议稿件
AN - SCOPUS:85135322799
T3 - 30th International Conference on Electrical Contacts, ICEC 2020 - Proceedings
SP - 562
EP - 567
BT - 30th International Conference on Electrical Contacts, ICEC 2020 - Proceedings
PB - Electrosuisse, Verband fur Elektro-, Energie und Informationstechnik
T2 - 30th International Conference on Electrical Contacts, ICEC 2020
Y2 - 7 June 2021 through 11 June 2021
ER -
