Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

The total secondary electron emission yields, γT, induced by impact of the fast ions Neq+ (q = 2-8) and Arq+ (q = 3-12) on Si and Neq+ (q = 2-8) on W targets have been measured. It was observed that for a given impact energy, γT increases with the charge of projectile ion. By plotting γT as a function of the total potential energy of the respective ion, true kinetic and potential electron yields have been obtained. Potential electron yield was proportional to the total potential energy of the projectile ion. However, decrease in potential electron yield with increasing kinetic energy of Neq+ impact on Si and W was observed. This decrease in potential electron yield with kinetic energy of the ion was more pronounced for the projectile ions having higher charge states. Moreover, kinetic electron yield to energy-loss ratio for various ion-target combinations was calculated and results were in good agreement with semi-empirical model for kinetic electron emission.

Original languageEnglish
Pages (from-to)474-478
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume265
Issue number2
DOIs
StatePublished - Dec 2007
Externally publishedYes

Keywords

  • Electron emission
  • Highly charged ions

Fingerprint

Dive into the research topics of 'Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions'. Together they form a unique fingerprint.

Cite this