Scanning probe microscopy electrical measurement technique and its application in low-dimensional materials: A review

Low-dimensional nanomaterials (LDNs) exhibit unique electrical properties at the nanoscale, making accurate electrical measurement crucial for advancements in materials science, condensed matter physics, electronic devices, chemistry, and biology. However, traditional electrical measurement techniques are limited by the measurement accuracy, which is difficult to adapt to the measurement needs of LDNs. In recent years, the widespread application of scanning probe microscopy (SPM) has promoted the development of highly sensitive, nanometer-precise electrical measurement tools, which have become essential for characterizing these materials. To this end, this review focuses on the electrical property measurement of LDNs. It begins by reviewing common electrical parameters of LDNs, followed by an in-depth introduction to seven typical SPM-based electrical measurement modes, including their basic principles, system components, and future trends. Then, the electrical measurement principles and specific applications of these methods in zero-dimensional (nanoparticles and quantum dots), one-dimensional (nanowires and nanoribbons), and two-dimensional (layers and thin films) nanomaterials are reviewed. Finally, an outlook on the development of SPM electrical measurement modes and their application to LDNs is presented.