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Scaling and Confinement in Ultrathin Chalcogenide Films as Exemplified by GeTe

  • Peter Kerres
  • , Yiming Zhou
  • , Hetal Vaishnav
  • , Mohit Raghuwanshi
  • , Jiangjing Wang
  • , Maria Häser
  • , Marc Pohlmann
  • , Yudong Cheng
  • , Carl Friedrich Schön
  • , Thomas Jansen
  • , Christophe Bellin
  • , Daniel E. Bürgler
  • , Abdur Rehman Jalil
  • , Christoph Ringkamp
  • , Hugo Kowalczyk
  • , Claus M. Schneider
  • , Abhay Shukla
  • , Matthias Wuttig
  • RWTH Aachen University
  • Jülich Research Centre
  • Xi'an Jiaotong University
  • Sorbonne Université

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

Chalcogenides such as GeTe, PbTe, Sb2Te3, and Bi2Se3 are characterized by an unconventional combination of properties enabling a plethora of applications ranging from thermo-electrics to phase change materials, topological insulators, and photonic switches. Chalcogenides possess pronounced optical absorption, relatively low effective masses, reasonably high electron mobilities, soft bonds, large bond polarizabilities, and low thermal conductivities. These remarkable characteristics are linked to an unconventional bonding mechanism characterized by a competition between electron delocalization and electron localization. Confinement, that is, the reduction of the sample dimension as realized in thin films should alter this competition and modify chemical bonds and the resulting properties. Here, pronounced changes of optical and vibrational properties are demonstrated for crystalline films of GeTe, while amorphous films of GeTe show no similar thickness dependence. For crystalline films, this thickness dependence persists up to remarkably large thicknesses above 15 nm. X-ray diffraction and accompanying simulations employing density functional theory relate these changes to thickness dependent structural (Peierls) distortions, due to an increased electron localization between adjacent atoms upon reducing the film thickness. A thickness dependence and hence potential to modify film properties for all chalcogenide films with a similar bonding mechanism is expected.

Original languageEnglish
Article number2201753
JournalSmall
Volume18
Issue number21
DOIs
StatePublished - 26 May 2022

Keywords

  • Peierls distortion
  • X-ray diffraction
  • metavalent bonding
  • molecular beam epitaxy
  • optical spectroscopy

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