Abstract
In this paper, we investigated the sensing properties of sandwich structure of TiO2/Pd/TiO2 thin films at various operating temperatures and oxygen partial pressures. The nanostructure TiO2 thin films were prepared by the sol-gel method. Various thickness of Pd buried layer was deposited by magnetron sputtering of a pure Pd target. The films were characterized using X-ray diffraction analysis and SEM. It was found that TiO2/Pd/TiO2 thin films have the p-type behavior while the pure TiO2 thin film is n-type semiconductor materials. We found that the structure of TiO2/Pd/TiO2 thin films with 10 s sputtering Pd layer has a better stability at 240 °C.
| Original language | English |
|---|---|
| Article number | 095002 |
| Journal | Review of Scientific Instruments |
| Volume | 84 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 2013 |