Response of 10-kV Metal-Oxide Surge Arresters Excited by Nanosecond-Level Transient Electromagnetic Disturbances

  • Yi Zhou
  • , Yan Zhao Xie
  • , Dao Zhong Zhang
  • , Ning Dong
  • , Yu Hao Chen
  • , Yan Jing

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

Nanosecond-level transient electromagnetic disturbance (TED), including very fast transient overvoltage caused by operation of disconnectors, high-altitude electromagnetic pulse, and many other fast transients may interfere or even damage the electrical equipment. As one of the main overvoltage protective equipment, the protective performance of metal-oxide surge arresters (MOAs) under nanosecond-level TED should be investigated and then compared with that under microsecond-level TED, especially the lightning impulse. Based on a testing platform containing a 400-kV pulse generator with adjustable rise time from 5 to 100 ns, the behaviors of nonlinearity, fast impulse response, and converting impedances of three types of 10-kV MOAs under TED with different rise time were explored experimentally in this article. The peak residual voltages of 10-kV MOAs under TED with the rise time of 5 ns at 5 kA are 50.2-60.7% higher than those under the lightning impulse. The rise time of TED has significant influence on the peak voltage and impedance converting behaviors of MOAs. A circuit model of 10-kV MOAs under nanosecond-level TED is built and validated by experimental results, which can be applied in insulation coordination and design of protective devices against TED.

Original languageEnglish
Article number9170910
Pages (from-to)614-621
Number of pages8
JournalIEEE Transactions on Electromagnetic Compatibility
Volume63
Issue number2
DOIs
StatePublished - Apr 2021

Keywords

  • Metal oxide surge arrester (MOA)
  • pulsed current injection (PCI)
  • transient electromagnetic disturbance (TED)

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