TY - GEN
T1 - Research on Secondary Electron Emission Characteristics of Metal Materials based on Monte-Carlo Simulation
AU - Tian, Siyu
AU - Chen, Yu
AU - Chen, Zecai
AU - Chen, Long
AU - Zhang, Chaobo
AU - Zhang, Sichao
AU - Hou, Xiaohan
AU - Wang, Shuang
AU - Cheng, Yonghong
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - With the rapid development of astronautics, various types of spacecrafts have been widely used. However, the secondary electron multiplication effect can affect the stability of the spacecraft. To solve this problem, it is necessary to study the secondary electron emission characteristics of metal materials. In this paper, the emission characteristics of secondary electrons, and the physical process of secondary electron radiation are introduced, and an elastic scattering cross-section model represented by mott cross-section and a model based on Penn dielectric function theory is established. The Monte Carlo method is the most common method in this field, on the basis of drawing a diagram, the effect of the incidence angle, sample material, and other factors on the secondary electron emission yield are analyzed, and finally, the correctness of the Monte Carlo method in this paper is verified by the comparison of simulation data and experimental data.
AB - With the rapid development of astronautics, various types of spacecrafts have been widely used. However, the secondary electron multiplication effect can affect the stability of the spacecraft. To solve this problem, it is necessary to study the secondary electron emission characteristics of metal materials. In this paper, the emission characteristics of secondary electrons, and the physical process of secondary electron radiation are introduced, and an elastic scattering cross-section model represented by mott cross-section and a model based on Penn dielectric function theory is established. The Monte Carlo method is the most common method in this field, on the basis of drawing a diagram, the effect of the incidence angle, sample material, and other factors on the secondary electron emission yield are analyzed, and finally, the correctness of the Monte Carlo method in this paper is verified by the comparison of simulation data and experimental data.
KW - Monte Carlo simulation
KW - scattering cross section
KW - secondary electron emission yield
UR - https://www.scopus.com/pages/publications/85150454933
U2 - 10.1109/ICSMD57530.2022.10058447
DO - 10.1109/ICSMD57530.2022.10058447
M3 - 会议稿件
AN - SCOPUS:85150454933
T3 - 2022 International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2022 - Proceedings
BT - 2022 International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2022 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2022
Y2 - 22 December 2022 through 24 December 2022
ER -