Abstract
Coplanar Capacitance Imaging Technology (CCIT) is a kind of nondestructive testing technology based on a capacitance sensing mechanism. However, the edge information of the image is often blurred, and making an accurate quantitative analysis of defects is impossible. This paper was concerned with scanning detection and locating defects based on the CCIT sensor of single-pair electrode. Firstly, the sensitivity distribution characteristics of the CCIT sensor of single-pair electrode were analyzed, and then the scanning detection and imaging scheme of the CCIT sensor of single-pair electrode were designed. Finally, the spatial location of defects was analyzed by using the capacitance values obtained by scanning detection and the visual images obtained by reconstructing. The feasibility of scanning detection and imaging of the coplanar single-pair electrode capacitance sensor was verified through experiments.
| Original language | English |
|---|---|
| Article number | 112060 |
| Journal | Measurement: Journal of the International Measurement Confederation |
| Volume | 204 |
| DOIs | |
| State | Published - 30 Nov 2022 |
| Externally published | Yes |
Keywords
- Coplanar Capacitance Imaging Technology
- Coplanar single-pair electrode capacitance sensor
- Nondestructive testing
- Scanning detection imaging
- Spatial location
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