Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios

Zhongqiang Hu; Beihai Ma; Shanshan Liu; Manoj Narayanan; Uthamalingam Balachandran

doi:10.1016/j.ceramint.2013.05.139

Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios

Zhongqiang Hu
, Beihai Ma
, Shanshan Liu
, Manoj Narayanan
, Uthamalingam Balachandran

Argonne National Laboratory

Research output: Contribution to journal › Article › peer-review

86 Scopus citations

Abstract

Ferroelectric lead lanthanum zirconate titanate (PLZT) films with 8 mol% lanthanum and different Zr/Ti ratios (70/30, 65/35, 58/42, 52/48, 45/55, and 40/60) have been grown on platinized silicon substrates by chemical solution deposition. The effects of the Zr/Ti ratios on the dielectric and ferroelectric properties were investigated for high-power energy storage applications. These films exhibited relaxor behavior and slim polarization-electric field hysteresis loops, and the degree of phase transition diffuseness decreased with increasing Ti. The PLZT films with Zr/Ti=52/48 had a high spontaneous polarization of ≈51.2 μC/cm², a low remanent polarization of ≈9.1 μC/cm², and a low coercive electric field of ≈25.9 kV/cm, leading to a recoverable energy density of ≈30 J/cm³ and a charge-discharge efficiency of ≈78% at room temperature. The high energy density and high efficiency indicate that relaxor PLZT with La/Zr/Ti=8/52/48 is a promising candidate for high-power film capacitors.

Original language	English
Pages (from-to)	557-562
Number of pages	6
Journal	Ceramics International
Volume	40
Issue number	1 PART A
DOIs	https://doi.org/10.1016/j.ceramint.2013.05.139
State	Published - Jan 2014
Externally published	Yes

Keywords

A. Sol-gel processes
C. Ferroelectric properties
D. PLZT
E. Capacitors

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10.1016/j.ceramint.2013.05.139

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@article{5a2ee4839201427aafdbaa257ff7c13d,

title = "Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios",

abstract = "Ferroelectric lead lanthanum zirconate titanate (PLZT) films with 8 mol\% lanthanum and different Zr/Ti ratios (70/30, 65/35, 58/42, 52/48, 45/55, and 40/60) have been grown on platinized silicon substrates by chemical solution deposition. The effects of the Zr/Ti ratios on the dielectric and ferroelectric properties were investigated for high-power energy storage applications. These films exhibited relaxor behavior and slim polarization-electric field hysteresis loops, and the degree of phase transition diffuseness decreased with increasing Ti. The PLZT films with Zr/Ti=52/48 had a high spontaneous polarization of ≈51.2 μC/cm2, a low remanent polarization of ≈9.1 μC/cm2, and a low coercive electric field of ≈25.9 kV/cm, leading to a recoverable energy density of ≈30 J/cm3 and a charge-discharge efficiency of ≈78\% at room temperature. The high energy density and high efficiency indicate that relaxor PLZT with La/Zr/Ti=8/52/48 is a promising candidate for high-power film capacitors.",

keywords = "A. Sol-gel processes, C. Ferroelectric properties, D. PLZT, E. Capacitors",

author = "Zhongqiang Hu and Beihai Ma and Shanshan Liu and Manoj Narayanan and Uthamalingam Balachandran",

year = "2014",

month = jan,

doi = "10.1016/j.ceramint.2013.05.139",

language = "英语",

volume = "40",

pages = "557--562",

journal = "Ceramics International",

issn = "0272-8842",

publisher = "Elsevier Ltd",

number = "1 PART A",

}

TY - JOUR

T1 - Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios

AU - Hu, Zhongqiang

AU - Ma, Beihai

AU - Liu, Shanshan

AU - Narayanan, Manoj

AU - Balachandran, Uthamalingam

PY - 2014/1

Y1 - 2014/1

N2 - Ferroelectric lead lanthanum zirconate titanate (PLZT) films with 8 mol% lanthanum and different Zr/Ti ratios (70/30, 65/35, 58/42, 52/48, 45/55, and 40/60) have been grown on platinized silicon substrates by chemical solution deposition. The effects of the Zr/Ti ratios on the dielectric and ferroelectric properties were investigated for high-power energy storage applications. These films exhibited relaxor behavior and slim polarization-electric field hysteresis loops, and the degree of phase transition diffuseness decreased with increasing Ti. The PLZT films with Zr/Ti=52/48 had a high spontaneous polarization of ≈51.2 μC/cm2, a low remanent polarization of ≈9.1 μC/cm2, and a low coercive electric field of ≈25.9 kV/cm, leading to a recoverable energy density of ≈30 J/cm3 and a charge-discharge efficiency of ≈78% at room temperature. The high energy density and high efficiency indicate that relaxor PLZT with La/Zr/Ti=8/52/48 is a promising candidate for high-power film capacitors.

AB - Ferroelectric lead lanthanum zirconate titanate (PLZT) films with 8 mol% lanthanum and different Zr/Ti ratios (70/30, 65/35, 58/42, 52/48, 45/55, and 40/60) have been grown on platinized silicon substrates by chemical solution deposition. The effects of the Zr/Ti ratios on the dielectric and ferroelectric properties were investigated for high-power energy storage applications. These films exhibited relaxor behavior and slim polarization-electric field hysteresis loops, and the degree of phase transition diffuseness decreased with increasing Ti. The PLZT films with Zr/Ti=52/48 had a high spontaneous polarization of ≈51.2 μC/cm2, a low remanent polarization of ≈9.1 μC/cm2, and a low coercive electric field of ≈25.9 kV/cm, leading to a recoverable energy density of ≈30 J/cm3 and a charge-discharge efficiency of ≈78% at room temperature. The high energy density and high efficiency indicate that relaxor PLZT with La/Zr/Ti=8/52/48 is a promising candidate for high-power film capacitors.

KW - A. Sol-gel processes

KW - C. Ferroelectric properties

KW - D. PLZT

KW - E. Capacitors

UR - https://www.scopus.com/pages/publications/84887622112

U2 - 10.1016/j.ceramint.2013.05.139

DO - 10.1016/j.ceramint.2013.05.139

M3 - 文章

AN - SCOPUS:84887622112

SN - 0272-8842

VL - 40

SP - 557

EP - 562

JO - Ceramics International

JF - Ceramics International

IS - 1 PART A

ER -

Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios

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Keywords

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