TY - JOUR
T1 - Relaxation models of the (110) zinc-blende III-V semiconductor surfaces
T2 - Density functional study
AU - Ye, Honggang
AU - Chen, Guangde
AU - Wu, Yelong
AU - Zhu, Youzhang
AU - Wei, Su Huai
PY - 2008/11/17
Y1 - 2008/11/17
N2 - Clean III-V zinc-blende (110) surfaces are the most extensively studied semiconductor surface. For conventional III-V compounds such as GaAs and InP, the surface relaxation follows a bond rotation relaxation model. However, for III-nitrides recent study indicates that they follow a bond-constricting relaxation model. First-principles atom relaxation calculations are performed to explore the origin of the difference between the two groups of materials. By analyzing the individual shift trends and ionic properties of the top layer anions and cations, we attribute the difference between the conventional and nitride III-V compounds to the strong electronegativity of N, which leads to the s2p3 pyramid bond angle to be larger than the ideal one in bulk (109.5°). The general trends of the atomic relaxation at the III-nitrides (110) surfaces are explained.
AB - Clean III-V zinc-blende (110) surfaces are the most extensively studied semiconductor surface. For conventional III-V compounds such as GaAs and InP, the surface relaxation follows a bond rotation relaxation model. However, for III-nitrides recent study indicates that they follow a bond-constricting relaxation model. First-principles atom relaxation calculations are performed to explore the origin of the difference between the two groups of materials. By analyzing the individual shift trends and ionic properties of the top layer anions and cations, we attribute the difference between the conventional and nitride III-V compounds to the strong electronegativity of N, which leads to the s2p3 pyramid bond angle to be larger than the ideal one in bulk (109.5°). The general trends of the atomic relaxation at the III-nitrides (110) surfaces are explained.
UR - https://www.scopus.com/pages/publications/57149142111
U2 - 10.1103/PhysRevB.78.193308
DO - 10.1103/PhysRevB.78.193308
M3 - 文章
AN - SCOPUS:57149142111
SN - 1098-0121
VL - 78
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 19
M1 - 193308
ER -