Relaxation models of the (110) zinc-blende III-V semiconductor surfaces: Density functional study

  • Honggang Ye
  • , Guangde Chen
  • , Yelong Wu
  • , Youzhang Zhu
  • , Su Huai Wei

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Clean III-V zinc-blende (110) surfaces are the most extensively studied semiconductor surface. For conventional III-V compounds such as GaAs and InP, the surface relaxation follows a bond rotation relaxation model. However, for III-nitrides recent study indicates that they follow a bond-constricting relaxation model. First-principles atom relaxation calculations are performed to explore the origin of the difference between the two groups of materials. By analyzing the individual shift trends and ionic properties of the top layer anions and cations, we attribute the difference between the conventional and nitride III-V compounds to the strong electronegativity of N, which leads to the s2p3 pyramid bond angle to be larger than the ideal one in bulk (109.5°). The general trends of the atomic relaxation at the III-nitrides (110) surfaces are explained.

Original languageEnglish
Article number193308
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number19
DOIs
StatePublished - 17 Nov 2008

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