Abstract
Atomically thin transition metal dichalcogenides (TMDs) are of interest for next-generation electronics and optoelectronics. Here, we demonstrate device-ready synthetic tungsten diselenide (WSe2) via metal-organic chemical vapor deposition and provide key insights into the phenomena that control the properties of large-area, epitaxial TMDs. When epitaxy is achieved, the sapphire surface reconstructs, leading to strong 2D/3D (i.e., TMD/substrate) interactions that impact carrier transport. Furthermore, we demonstrate that substrate step edges are a major source of carrier doping and scattering. Even with 2D/3D coupling, transistors utilizing transfer-free epitaxial WSe2/sapphire exhibit ambipolar behavior with excellent on/off ratios (∼107), high current density (1-10 μA·μm-1), and good field-effect transistor mobility (∼30 cm2·V-1·s-1) at room temperature. This work establishes that realization of electronic-grade epitaxial TMDs must consider the impact of the TMD precursors, substrate, and the 2D/3D interface as leading factors in electronic performance.
| Original language | English |
|---|---|
| Pages (from-to) | 965-975 |
| Number of pages | 11 |
| Journal | ACS Nano |
| Volume | 12 |
| Issue number | 2 |
| DOIs | |
| State | Published - 27 Feb 2018 |
| Externally published | Yes |
Keywords
- field-effect transistors
- metal-organic chemical vapor deposition (MOCVD)
- transition metal dichalcogenides
- tungsten diselenide (WSe)
- two-dimensional materials
- van der Waals epitaxy
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