Abstract
We report on the realization of short-range-ordered arrays of nanoscale resistive switching blocks in epitaxial Nb-doped SrTiO3 thin films. These blocks can be individually addressed by the tip of a conductive tip atomic force microscope and reversibly switched between a high and a low resistance state reaching an Roff to Ron ratio of up to 50. Scanning micrometer-scale areas with an appropriately biased tip, all blocks within the scanned area can be switched between the two resistive states. We suggest a connection between these nanoscale switching blocks and defect-rich nanoclusters which were detected with high resolution transmission electron microscopy.
| Original language | English |
|---|---|
| Article number | 023110 |
| Journal | Applied Physics Letters |
| Volume | 93 |
| Issue number | 2 |
| DOIs | |
| State | Published - 14 Jul 2008 |
| Externally published | Yes |
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