Quantitative scanning laue diffraction microscopy: Application to the study of 3d printed nickel-based superalloys

Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.