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Quality factor of micro cantilevers transduced by piezoelectric lead zirconate titanate film

  • Jian Lu
  • , Tsuyoshi Ikehara
  • , Takeshi Kobayashi
  • , Ryutaro Maeda
  • , Takashi Mihara
  • National Institute of Advanced Industrial Science and Technology
  • Olympus Corporation

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

The quality factors (Q-factor) of micro cantilevers transduced by piezoelectric lead zirconate titanate (PZT) film under atmospheric pressure conditions were investigated and discussed. It was found that Q-factors increased with thicker PZT film. Due to air damping, shorter cantilevers resulted in preferred larger Q-factors. The Q-factor was found to be as high as 450 for a 150-μm long PZT cantilever when using 1.04-μm thick PZT film as the electromechanical conversion medium. Differences in the measured Q-factors when using integrated PZT film self-excitation and external PZT vibrator actuation indicate that energy dissipation induced by the electromechanical coupling in PZT thin films was noteworthy even under atmospheric pressure conditions. Moreover, the mechanical properties of the PZT film were found contribute significantly to decreases of the Q-factor.

Original languageEnglish
Pages (from-to)1517-1522
Number of pages6
JournalMicrosystem Technologies
Volume13
Issue number11-12
DOIs
StatePublished - Jul 2007
Externally publishedYes

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