Profile measurement by Beam Induced Fluorescence for 60 to 750 MeV/u heavy ion beams

F. Becker; C. Andre; P. Forck; D. H.H. Hoffmann; H. Iwase

Profile measurement by Beam Induced Fluorescence for 60 to 750 MeV/u heavy ion beams

F. Becker
, C. Andre
, P. Forck
, D. H.H. Hoffmann
, H. Iwase

GSI Helmholtz Centre for Heavy Ion Research
Technische Universität Darmstadt

Research output: Contribution to conference › Paper › peer-review

5 Scopus citations

Abstract

For intense heavy ion beams, as planned for the facility for anti-proton and ion research (FAIR) non-destructive methods for the transverse beam profile determination are required. We experimentally investigated the Beam Induced Fluorescence (BIF) method. Due to atomic collisions with the beam ions, the residual gas N₂ is excited to fluorescence levels. Single photons were detected by a double MCP image intensifier coupled to a digital CCD camera. Our experimental studies (with lower ion currents which are available today) aimed to determine the photon yield and the background contribution for different ion species (Xe, Ta, U) and beam energies from 60 to 750 MeV/u. The measured profiles are in good agreement with other methods.

Original language	English
Pages	1013-1015
Number of pages	3
State	Published - 2006
Externally published	Yes
Event	10th European Particle Accelerator Conference, EPAC 2006 - Edinburgh, United Kingdom Duration: 26 Jun 2006 → 30 Jun 2006

Conference

Conference	10th European Particle Accelerator Conference, EPAC 2006
Country/Territory	United Kingdom
City	Edinburgh
Period	26/06/06 → 30/06/06

Cite this

@conference{20f3bec0ad3b4a5dbca985b7c17edfe6,

title = "Profile measurement by Beam Induced Fluorescence for 60 to 750 MeV/u heavy ion beams",

abstract = "For intense heavy ion beams, as planned for the facility for anti-proton and ion research (FAIR) non-destructive methods for the transverse beam profile determination are required. We experimentally investigated the Beam Induced Fluorescence (BIF) method. Due to atomic collisions with the beam ions, the residual gas N2 is excited to fluorescence levels. Single photons were detected by a double MCP image intensifier coupled to a digital CCD camera. Our experimental studies (with lower ion currents which are available today) aimed to determine the photon yield and the background contribution for different ion species (Xe, Ta, U) and beam energies from 60 to 750 MeV/u. The measured profiles are in good agreement with other methods.",

author = "F. Becker and C. Andre and P. Forck and Hoffmann, \{D. H.H.\} and H. Iwase",

year = "2006",

language = "英语",

pages = "1013--1015",

note = "10th European Particle Accelerator Conference, EPAC 2006 ; Conference date: 26-06-2006 Through 30-06-2006",

}

TY - CONF

T1 - Profile measurement by Beam Induced Fluorescence for 60 to 750 MeV/u heavy ion beams

AU - Becker, F.

AU - Andre, C.

AU - Forck, P.

AU - Hoffmann, D. H.H.

AU - Iwase, H.

PY - 2006

Y1 - 2006

N2 - For intense heavy ion beams, as planned for the facility for anti-proton and ion research (FAIR) non-destructive methods for the transverse beam profile determination are required. We experimentally investigated the Beam Induced Fluorescence (BIF) method. Due to atomic collisions with the beam ions, the residual gas N2 is excited to fluorescence levels. Single photons were detected by a double MCP image intensifier coupled to a digital CCD camera. Our experimental studies (with lower ion currents which are available today) aimed to determine the photon yield and the background contribution for different ion species (Xe, Ta, U) and beam energies from 60 to 750 MeV/u. The measured profiles are in good agreement with other methods.

AB - For intense heavy ion beams, as planned for the facility for anti-proton and ion research (FAIR) non-destructive methods for the transverse beam profile determination are required. We experimentally investigated the Beam Induced Fluorescence (BIF) method. Due to atomic collisions with the beam ions, the residual gas N2 is excited to fluorescence levels. Single photons were detected by a double MCP image intensifier coupled to a digital CCD camera. Our experimental studies (with lower ion currents which are available today) aimed to determine the photon yield and the background contribution for different ion species (Xe, Ta, U) and beam energies from 60 to 750 MeV/u. The measured profiles are in good agreement with other methods.

UR - https://www.scopus.com/pages/publications/84898792294

M3 - 论文

AN - SCOPUS:84898792294

SP - 1013

EP - 1015

T2 - 10th European Particle Accelerator Conference, EPAC 2006

Y2 - 26 June 2006 through 30 June 2006

ER -

Profile measurement by Beam Induced Fluorescence for 60 to 750 MeV/u heavy ion beams

Abstract

Conference

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