TY - GEN
T1 - Process parameters of mold fabrication for nano-imprint lithography
AU - Le, Yan
AU - Li, Hansong
AU - Liu, Hongzhong
PY - 2010
Y1 - 2010
N2 - In nano-imprint lithography, PDMS is chosen to be soft mold material, which has features of excellent demolding character and large transferring area of imprinting pattern. Besides, the soft mold uses quartz as substrate. Impacts of technical parameters, such as the vacuum casting pressure, the curing temperature and time, on PDMS performance are analyzed. The experiments results show that the vacuum pressure is 2.3×10-2 Pa; the curing temperature is 40 °C, and the curing time is 45 hours. These optimized parameters keep adequate demold and pattern accuracy, thus adoption of PDMS soft mold could not only fulfill the precision NIL process, but also improve productivity.
AB - In nano-imprint lithography, PDMS is chosen to be soft mold material, which has features of excellent demolding character and large transferring area of imprinting pattern. Besides, the soft mold uses quartz as substrate. Impacts of technical parameters, such as the vacuum casting pressure, the curing temperature and time, on PDMS performance are analyzed. The experiments results show that the vacuum pressure is 2.3×10-2 Pa; the curing temperature is 40 °C, and the curing time is 45 hours. These optimized parameters keep adequate demold and pattern accuracy, thus adoption of PDMS soft mold could not only fulfill the precision NIL process, but also improve productivity.
KW - Imprint lithography
KW - PDMS
KW - Soft mold
UR - https://www.scopus.com/pages/publications/79952221979
U2 - 10.1109/iCECE.2010.1316
DO - 10.1109/iCECE.2010.1316
M3 - 会议稿件
AN - SCOPUS:79952221979
SN - 9780769540313
T3 - Proceedings - International Conference on Electrical and Control Engineering, ICECE 2010
SP - 5421
EP - 5424
BT - Proceedings - International Conference on Electrical and Control Engineering, ICECE 2010
T2 - International Conference on Electrical and Control Engineering, ICECE 2010
Y2 - 26 June 2010 through 28 June 2010
ER -