Probing the mechanical properties of nanostructures in the TEM

A. M. Minor; J. Ye; C. Chisholm; R. K. Mishra; Z. W. Shan; O. L. Warren

doi:10.1017/S1431927609096901

Probing the mechanical properties of nanostructures in the TEM

A. M. Minor
, J. Ye
, C. Chisholm
, R. K. Mishra
, Z. W. Shan
, O. L. Warren

University of California at Berkeley
General Motors
Bruker Corporation

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1184-1185
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609096901
State	Published - Jul 2009
Externally published	Yes

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title = "Probing the mechanical properties of nanostructures in the TEM",

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language = "英语",

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AU - Minor, A. M.

AU - Ye, J.

AU - Chisholm, C.

AU - Mishra, R. K.

AU - Shan, Z. W.

AU - Warren, O. L.

PY - 2009/7

Y1 - 2009/7

UR - https://www.scopus.com/pages/publications/69949187215

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M3 - 文章

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SN - 1431-9276

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Probing the mechanical properties of nanostructures in the TEM

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