TY - JOUR
T1 - Preparation and properties of a thermal insulating layer and a buffer layer for multilayer pyroelectric film infrared detector
AU - Wu, Xiaoqing
AU - Yao, Xi
AU - Wang, Minqiang
AU - Gao, Lumei
AU - Ren, Wei
PY - 2003
Y1 - 2003
N2 - A thermal insulating layer and a buffer layer play a key role in the multilayer pyroelectric thin film infrared detector. In this work, a porous SiO2 film serving as thermal insulating layer and a dense SiO 2 film serving as buffer layer were prepared by sol-gel method. The porosities of the porous film and the dense film are about 50% and 6%, respectively. Maximum thickness values of a single layer porous film and that of a single layer dense film all come up to 1.5 μm. Rms (root-mean-square) surface roughness of the porous film is about 40 nm and that of the dense film is about 1.5 nm. Experimental result shows 0.4 μm dense SiO2 film can flatten rough surface of the porous SiO2 film, and the rms surface roughness is less than 5 nm. The composite SiO2 film can effectively block thermal diffusion.
AB - A thermal insulating layer and a buffer layer play a key role in the multilayer pyroelectric thin film infrared detector. In this work, a porous SiO2 film serving as thermal insulating layer and a dense SiO 2 film serving as buffer layer were prepared by sol-gel method. The porosities of the porous film and the dense film are about 50% and 6%, respectively. Maximum thickness values of a single layer porous film and that of a single layer dense film all come up to 1.5 μm. Rms (root-mean-square) surface roughness of the porous film is about 40 nm and that of the dense film is about 1.5 nm. Experimental result shows 0.4 μm dense SiO2 film can flatten rough surface of the porous SiO2 film, and the rms surface roughness is less than 5 nm. The composite SiO2 film can effectively block thermal diffusion.
KW - Buffer layer
KW - Multilayer pyroelectric thin film structure
KW - Pyroelectric infrared detector
KW - Root-mean-square surface roughness
KW - Thermal insulating layer
UR - https://www.scopus.com/pages/publications/4344624511
U2 - 10.1080/10584580390229833
DO - 10.1080/10584580390229833
M3 - 文章
AN - SCOPUS:4344624511
SN - 1058-4587
VL - 51
SP - 73
EP - 79
JO - Integrated Ferroelectrics
JF - Integrated Ferroelectrics
ER -