Abstract
Lead-free ferroelectric 0.82K0.5Na0.5NbO3-0.18AgNbO3 (KNN-AN) films were successfully synthesized by a chemical solution deposition (CSD) method. In particular, silver acetate was dissolved in 2-methoxyethanol with the aid of nitric acid and molecular sieve was used to remove residual moisture in the precursor solution at room temperature. The effects of the thickness on the structures and electrical properties of the KNN-AN films were systematically investigated. The KNN-AN film with the thickness of 2.53 μm showed good dielectric properties and well saturated polarization-electric field hysteresis loops.
| Original language | English |
|---|---|
| Pages (from-to) | S228-S233 |
| Journal | Ceramics International |
| Volume | 41 |
| Issue number | S1 |
| DOIs | |
| State | Published - 1 Jul 2015 |
Keywords
- Chemical solution deposition method
- Electrical properties
- KNN-AN films
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