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Preparation and characterization of narrow size distribution pmsq microspheres for high-frequency electronic packaging

  • Guodong Meng
  • , Yimeng Li
  • , Zhengdong Wang
  • , Cheng Pan
  • , Wenwu Gao
  • , Yonghong Cheng
  • Xi'an Jiaotong University
  • Xi'an University of Architecture and Technology
  • Wuhan University

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Polymethylsilsesquioxane (PMSQ) has become a kind of widely studied filler used in the electronic circuit board substrates due to its organic-inorganic hybrid structure, low dielectric constant, and good thermal stability, among other factors. Herein, the PMSQ microspheres were prepared by a two-step acid-base-catalyzed sol-gel method; the influences of reaction conditions including the ratio of water/methyltrimethoxysilane (MTMS), reaction temperature, concentration of the catalyst, and stirring time were systematically investigated; and the optimized reaction condition was then obtained towards a narrow particle size distribution and good sphericity. The microstructure of PMSQ microspheres was analyzed by the infrared spectrum and X-ray diffraction (XRD), which indicated that the as-prepared PMSQ had a ladder-dominant structure. The thermogravimetric analysis (TGA) demonstrated an excellent thermal stability of as-prepared PMSQ microspheres. More specifically, the dielectric constants at high frequency (1~20 GHz) of as-prepared PMSQ microspheres were measured to be about 3.7, which turned out a lower dielectric constant compared to SiO2 powder (≈4.0). This study paves the way to further improve the performance of the electronic circuit board substrates for the application of high-frequency electronic packaging.

Original languageEnglish
Article number4233
JournalMaterials
Volume14
Issue number15
DOIs
StatePublished - 1 Aug 2021

Keywords

  • High-frequency dielectric properties
  • Narrow size distribution
  • Polymethylsilsesquioxane microspheres
  • Sphericity
  • Thermal stability

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