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Point to set similarity based deep feature learning for person re-identification

  • Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

150 Scopus citations

Abstract

Person re-identification (Re-ID) remains a challenging problem due to significant appearance changes caused by variations in view angle, background clutter, illumination condition and mutual occlusion. To address these issues, conventional methods usually focus on proposing robust feature representation or learning metric transformation based on pairwise similarity, using Fisher-type criterion. The recent development in deep learning based approaches address the two processes in a joint fashion and have achieved promising progress. One of the key issues for deep learning based person Re-ID is the selection of proper similarity comparison criteria, and the performance of learned features using existing criterion based on pairwise similarity is still limited, because only Point to Point (P2P) distances are mostly considered. In this paper, we present a novel person Re-ID method based on Point to Set similarity comparison. The Point to Set (P2S) metric can jointly minimize the intra-class distance and maximize the interclass distance, while back-propagating the gradient to optimize parameters of the deep model. By utilizing our proposed P2S metric, the learned deep model can effectively distinguish different persons by learning discriminative and stable feature representations.comprehensive experimental evaluations on 3DPeS, CUHK01, PRID2011 and Market1501 datasets demonstrate the advantages of our method over the state-of-the-art approaches.

Original languageEnglish
Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages5028-5037
Number of pages10
ISBN (Electronic)9781538604571
DOIs
StatePublished - 6 Nov 2017
Event30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017 - Honolulu, United States
Duration: 21 Jul 201726 Jul 2017

Publication series

NameProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Volume2017-January

Conference

Conference30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Country/TerritoryUnited States
CityHonolulu
Period21/07/1726/07/17

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