Skip to main navigation Skip to search Skip to main content

PHYSICS-INFORMED SELF-TRAINING LEARNING FOR SEISMIC IMAGING

  • Y. Zhang
  • , C. Li
  • , Z. Gao
  • , Z. Li
  • Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Reverse time migration (RTM) may produce low-resolution images because the RTM image is the convolution of subsurface reflectivity and the Hessian matrix. Neural network can approximate the inverse Hessian matrix and then be used to predict subsurface reflectivity from the RTM image. However, seismic surveys cannot provide enough label to train a neural network with good generalization ability. To solve this problem, we propose a physics-informed self-training learning method to approximate the inverse Hessian matrix. We introduce the demigration and adjoint operators as physical constraints to generate dataset for the neural network and train a long short-term memory network in a self-training learning framework. The trained network is then used to deblur the RTM image and obtain the subsurface reflectivity. Imaging tests on the synthetic data of the Marmousi model illustrate that the proposed method can produce reflectivity with higher resolution and less noise compared with the data-driven method in case of small samples.

Original languageEnglish
Title of host publication83rd EAGE Conference and Exhibition 2022
PublisherEuropean Association of Geoscientists and Engineers, EAGE
Pages3426-3430
Number of pages5
ISBN (Electronic)9781713859314
StatePublished - 2022
Event83rd EAGE Conference and Exhibition 2022 - Madrid, Virtual, Spain
Duration: 6 Jun 20229 Jun 2022

Publication series

Name83rd EAGE Conference and Exhibition 2022
Volume5

Conference

Conference83rd EAGE Conference and Exhibition 2022
Country/TerritorySpain
CityMadrid, Virtual
Period6/06/229/06/22

Fingerprint

Dive into the research topics of 'PHYSICS-INFORMED SELF-TRAINING LEARNING FOR SEISMIC IMAGING'. Together they form a unique fingerprint.

Cite this