Phase composition, microstructure and thermal diffusivity of Cu/Si composites sintering temperature dependence

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Abstract

Cu/Si composites may become novel high-performance electronic packaging materials owing to combining the advantages of copper and silicon components. Here, we prepared Cu/Si composites by being sintered below and above eutectic temperature 802 °C, respectively, and found that sintering temperature notably affects their composition, microstructure and thermal diffusivity. The composites sintered at 780 °C are composed of copper and silicon, exhibiting dispersed silicon particles and continuous copper matrix, but those sintered at 820 °C primarily contain Cu3Si compounds, and a porous microstructure is observed. The thermal diffusivity of the former is over 21 times higher than that of the latter.

Original languageEnglish
Title of host publicationStructural Integrity and Failure, SIF 2010
Pages200-203
Number of pages4
DOIs
StatePublished - 2011
EventInternational Conference on Structural Integrity and Failure, SIF2010 - Auckland, New Zealand
Duration: 4 Jul 20107 Jul 2010

Publication series

NameAdvanced Materials Research
Volume275
ISSN (Print)1022-6680

Conference

ConferenceInternational Conference on Structural Integrity and Failure, SIF2010
Country/TerritoryNew Zealand
CityAuckland
Period4/07/107/07/10

Keywords

  • Cu/Si composites
  • Microstructure
  • Phase
  • Sintering temperature
  • Thermal diffusivity

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