TY - GEN
T1 - Performance analysis of microchip electrophoresis with portable UV absorbance detection system
AU - Li, Tian
AU - Wei, Wang
AU - Xiaowei, Liu
PY - 2012
Y1 - 2012
N2 - This paper presents a portable miniaturized integration UV-VIS absorbance detection system for the microchip electrophoresis (MCE). The TOCON_nano high sensitive SiC pre-amplified UV Sensor (Sglux GmbH, Ostendstrasse, Berlin, Germany) is used to measure extremely low UV radiation intensities in the nanowatt scale. This detection system volume is 280 ×200×150 mm3, the weight is less than 2Kg. The PMMA was used as the MCE substrate materials. And the electrophoresis microchannels are fabricated with the CNC milling, have the cross section area of 150μm ×150μm. With this detection system, the detection limit for the Cl- electrophoresis can reach 10-10mol at the indirect UV-VIS detection mode. Two inorganic ions Cl- and SO4 2- could reach the baseline separation in 3 min.
AB - This paper presents a portable miniaturized integration UV-VIS absorbance detection system for the microchip electrophoresis (MCE). The TOCON_nano high sensitive SiC pre-amplified UV Sensor (Sglux GmbH, Ostendstrasse, Berlin, Germany) is used to measure extremely low UV radiation intensities in the nanowatt scale. This detection system volume is 280 ×200×150 mm3, the weight is less than 2Kg. The PMMA was used as the MCE substrate materials. And the electrophoresis microchannels are fabricated with the CNC milling, have the cross section area of 150μm ×150μm. With this detection system, the detection limit for the Cl- electrophoresis can reach 10-10mol at the indirect UV-VIS detection mode. Two inorganic ions Cl- and SO4 2- could reach the baseline separation in 3 min.
KW - Baseline separation
KW - Microchip electrophoresis(MCE)
KW - SiC
KW - UV-Vis detection
UR - https://www.scopus.com/pages/publications/84870600174
U2 - 10.4028/www.scientific.net/AMM.220-223.1883
DO - 10.4028/www.scientific.net/AMM.220-223.1883
M3 - 会议稿件
AN - SCOPUS:84870600174
SN - 9783037855034
T3 - Applied Mechanics and Materials
SP - 1883
EP - 1886
BT - Advances in Manufacturing Technology
T2 - 2nd International Conference on Advanced Design and Manufacturing Engineering, ADME 2012
Y2 - 16 August 2012 through 18 August 2012
ER -