Origins and effects of deep traps in functional group grafted polymeric dielectric materials

Introducing deep traps by grafting functional groups on molecular chains of polymeric dielectric materials has been proved as an effective way to improve their electrical properties, especially suppressing the space charge injection and accumulation. However, the underlying physical mechanism of the origins and effects of deep traps on the electrical properties of polymeric dielectrics has not been fully understood. In order to explore the origins and effects of deep traps in grafted polymers, both simulations of electronic band structures as well as 3D electric potential distributions at molecular level and experiments on the macroscopic trap level distributions are carried out. The simulation and experiment results reveal that the deep traps in grafted polymers originate from the different electronic band structures of the grafted polymer compared with the pristine polymer. The deep traps would capture charge carriers and inhibit the charge transport, which leads to decreased conduction current and suppressed space charge injection and accumulation. This work provides a deep understanding of the origins of deep traps in grafted polymers and their effects on the electrical properties, which may guide the rational design of high-performance polymeric dielectric and insulation materials.