Abstract
The N-doped β-Ga2O3 films were grown on Si and quartz substrates by RF magnetron sputtering in different ammonia partial pressure ratios (from 0% to 30%). The influence of ammonia partial pressure ratio and annealing treatment on the optical and structural properties were studied. The microstructure, optical transmittance, optical absorption and optical energy gap of the N-doped β-Ga2O3 films were significantly changed with the increasing of ammonia partial pressure. The green, blue and ultraviolet emission bands were observed and discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 852-856 |
| Number of pages | 5 |
| Journal | Guangzi Xuebao/Acta Photonica Sinica |
| Volume | 40 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2011 |
| Externally published | Yes |
Keywords
- N-doped β-GaO
- Optical band gap
- Post-annealed
- RF magnetron sputtering
- Transparent conductive oxide
Fingerprint
Dive into the research topics of 'Optical properties of N-doped β-Ga2O3 films deposited by RF magnetron sputtering'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver